A Digital Instruments Multimode atomic force microscope and various accessories allow a number of scanning probe techniques to be performed. A wide range of researchers use our AFM for conventional contact mode and tapping mode topographical measurements. In addition, the Nanoscope IV controller provides dual Z actuator capability for faster scanning and also provides enhanced phase measurements. Three different sample scanners are available for imaging X-Y areas up 125 x 125 um in size and measuring Z dimensions down to sub-angstrom resolution. An atmospheric hood may be used for environmental control. A signal access module allows interfacing internal and external signals for setting up specialized techniques such as friction measurements. Other techniques include electric force and magnetic force imaging.

A fluid cell is available for characterization under wet conditions.

A Hysitron Triboscope attaches to the Multimode scanner and provides the capability of quantitative depth-sensing nanoindentation along with in-situ imaging.

The AFM/Nanoindenter facility is located in room 175 Materials Science and Engineering Building and is managed by the staff of the Materials Science Center.

Contact John Jacobs for assistance. (jacobs@engr.wisc.edu, phone 262-3787)