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Description:
A transmission electron microscope (TEM) with an operating voltage range of
20 to 120 kV. Analytical capabilities include energy dispersive
spectroscopy (EDX), and a video camera which allows magnifications of thin
samples (<500 nm) up to 700,000 times.
Equipment:
The Tecnai T12 microscope combines all imaging, diffraction, and analytical
techniques at good spatial resolution and detection efficiency. A variety
of heating, cooling and straining sample holders are available for use with
this microscope.
Application-Specific Modes
- Bright- and dark-field imaging.
- TEM microprobe and nanoprobe analysis.
- Small-probe convergent beam.
- Large specimen tilt compatible with high resolution.
- Conical dark-field imaging.
Accessories:
Specimen Holders
- Double tilt, single tilt, and tilt-rotate holders.
- Single and double tilt cooling.
- Single and double tilt heating.
- Straining holder.
- Low background single tilt EDX holder.
Energy Dispersive X-ray Spectrometer - EDAX PV9900 with an
ultrathin window Si detector can detect characteristic x-rays generated by
the electron beam from boron to uranium. Software allows for analysis
of signals, line scan profiles across specimens, digital elemental mapping,
background subtraction, and automatic peak identification. Spectra may
be transferred to a Mac and analyzed using the NIST
DTSA program
Applications:
- Composition analysis structure of grain boundaries in ceramics.
- Magnetic films on chromium.
- Identification of precipitates in materials.
- Analysis of nanoparticle sizes.
Capabilities:
- Sample size: 3 nm discs < 1 mm thick
- Point-point resolution: 0.34 nm
- Line resolution: 0.2 nm
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