Description

Wide-angle x-ray scattering is used to study structural characteristics and to identify powders, thin films and crystals. Data analysis is performed using

Equipment

• Siemens D-500 Diffractometer with 2.2 kW sealed cobalt source
• Single Crystal Graphite Monochromater
• Scintillation Counter Detector

Accessories

• Laue camera for orientation of single crystals
• ICDD library on CD-ROM
• 40 position sample changer
• High Temperature Stage (ambient to 1400°C) with atmospheric control

Applications

• Phase identification
• Thin-film analysis
• Lattice parameter determination
• Purity/quality control of materials
• Determination of crystallinity of polycrystalline materials
• Stress analysis
• Orientation of single crystals
• Analysis of superlattice structures
• Particle size determination
• Quantitative analysis

Specifications

Samples can be analyzed in many forms, including powders, thin films, crystals, and solutions.