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Description:
A field-emission gun transmission electron microscope (FEG-TEM) with an
operating voltage range of 50 to 300 kV. The high-brightness, high
coherency gun will allow large electron probe currents to be focused onto
nanometer sized areas of the specimen. Analytical capabilities include
energy dispersive spectroscopy (EDX), and a CCD camera which allows magnifications
of thin samples (<500 nm) up to >1 million times.
Equipment:
The Tecnai G2 30 microscope combines all imaging, diffraction, and analytical
techniques at high spatial resolution and detection efficiency.
Application-Specific Modes
- High-resolution bright- and dark-field imaging.
- TEM microprobe and nanoprobe analysis.
- Small-probe convergent beam.
- Large specimen tilt compatible with high resolution.
- STEM imaging.
- High angle annular dark-field imaging.
Accessories:
Specimen Holders - Double tilt and single tilt holders.
Energy Dispersive X-ray Spectrometer - EDAX rTEM with an
ultrathin window Si detector can detect characteristic x-rays generated by
the electron beam from boron to uranium. Software allows for analysis
of signals, line scan profiles across specimens, digital elemental mapping,
background subtraction, and automatic peak identification.
Applications:
- Composition analysis structure of grain boundaries in ceramics.
- Lattice imaging of defects semi-conductor epitaxy, growth, and defects
in analysis and metrology.
- Magnetic films on chromium.
- Identification of precipitates in materials.
Capabilities:
- Sample size: 3 nm discs < 1 mm thick
- Point-point resolution: 0.20 nm
- Information limit: 0.14 nm
- HR-STEM resolution: 0.17 nm
- Maximum specimen tilt: 40°
- Drift rate: <1 nm / min
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