The MRSEC Facilities Network is a nationwide partnership of NSF supported MRSEC centers designed to provide support to researchers in the broad area of Materials Research in academic, government and industrial laboratories around the world.
Field Emission Gun Scanning Electron Microscope
Description:
Field-emission gun Scanning electron microscope (FEG-SEM) equipped with an
energy dispersive spectrometer (EDS). It operates at 0.5 to 30 kV with
an ultimate resolution of 1.5 nm, and a magnification range of 10x to
400,000x. Available image modes include secondary and backscattered
electron images, X-Ray mapping, electron backscatter diffraction and
cathodoluminescence.
Equipment:
JEOL 6500 with a variety of sample holders.
Backscattered imaging at TV rates and low voltage using the Centaurus
detector.
Chemical analysis of bulk samples with elements as low as sodium
available using a Thermo-Noran Vantage system.
Cathodoluminescence analysis with a Gatan (Oxford) MonoCL 2 system.
Crystallographic analysis with a EBSD system from HKL allowing pattern
indexing and texture mapping with Channel 5 software.
Accessories:
Back scatter detector
EDS system
Specimen current detector
Electron Backscatter patterns
Cathodoluminescence
Chamberscope for optical viewing specimen in the microscope.
Applications:
Examination of fracture surfaces.
Phase identification from geological samples.
Examination and quantification of nano-scratch tests.
Stereo-imaging of surfaces.
Microstructure of surfactant systems.
Evaluation of lithographic specimens.
Measurement of the width of layers of magnetic read devices.
