The MRSEC Facilities Network is a nationwide partnership of NSF supported MRSEC centers designed to provide support to researchers in the broad area of Materials Research in academic, government and industrial laboratories around the world.
Field Emission Gun Scanning Electron Microscope I
Description:
A cold field-emission gun Scanning electron microscope (FEG-SEM). It
operates at 0.5 to 30 kV with an ultimate resolution of 1.0 nm, and a
magnification range of 10x to 700,000x. Available image modes include
secondary and backscattered electron imaging.
Equipment:
JEOL 6700 with a variety of sample holders.
Backscattered imaging at TV rates and low voltage using the
Centaurus detector.
Accessories:
Back scatter detector
Chamberscope for optical viewing specimen in the microscope.
Applications:
Examination of fracture surfaces
Examination and quantification of nano-scratch tests
Stereo-imaging of surfaces
Microstructure of surfactant systems
Measurement of the width of layers of magnetic read devices
