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Description
Wide-angle x-ray scattering is used to study structural characteristics and to
identify powders, thin films and crystals. Data analysis is performed using Materials Data Incorporated's JADE 7.0
software package with whole pattern fitting. Phase identification is possible
using ICDD's PDF-4 database.
Equipment
- Bruker-AXS D5005 Diffractometer with 2.2 kW sealed Cu Source
- Diffracted Beam Monochromater
- Scintillation Counter Detector
Applications
- Phase identification
- Thin-film analysis
- Lattice parameter determination
- Purity/quality control of materials
- Determination of crystallinity of polycrystalline materials
- Stress analysis
- Orientation of single crystals
- Particle size determination
Accessories
Specifications
Samples can be analyzed in solid, powder, thin film and solution form.
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