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The MRSEC Facilities Network is a nationwide partnership of NSF supported MRSEC centers designed to provide support to researchers in the broad area of Materials Research in academic, government and industrial laboratories around the world.
6 meter - High Resolution - 2D Area Detector

6 meter - High Resolution - 2D Area Detector

Description

Small-angle x-ray scattering is useful for structural analysis of liquid crystal, microemulsions and polymer films. The six meter small angle x-ray scattering (SAXS) line combines cross-coupled multilayer parallel beam optics, pinhole collimation and a long sample-to-detector distance to create a system with high resolution at low Bragg angles. In addition to the regular sample holder there is the option of simultaneous SAXS and rheometry (shearing), differential scanning calorimetry, or mechanical manipulation of the sample.

Equipment

  • Rigaku Ultrex 18 kw generator with copper radiation
  • Osmic cross-coupled primary beam parallel optics
  • Pinhole collimation system designed by Molecular Structure Corporation in conjunction with Osmic
  • Sample chamber with temperature control (-20°C to 250°C)
  • Bruker Hi-Star multi-wire area detector

Applications

  • Structural analysis of liquid crystals, microemulsions, and polymer films
  • Determination of radius of gyration of microspheres
  • Analysis of lamellar systems
  • Study of oriented structures
  • Measurement of dimensions and symmetries of microstructured materials (block copolymers, surfactant suspensions, zeolites, liquid crystals)
  • Structural analysis while shearing
  • Simultaneous differential scanning calorimetry and SAXS
  • Study of microstructural aspects of mechanical deformation

Accessories

  • Rheometric Scientific Dynamic Mechanical Thermal Analyzer
  • Operational in any orientation
  • Temperature range: -150°C to 600°C
  • Force Resolution: 0.0001N
  • Capable of six different modes of deformation
  • Linkham differential scanning calorimeter (-196°C to 600°C)
  • Minimat Miniature Mechanical Testing Device (creep, tensile, compression, cyclic, stress relaxation)

Specifications

Data can be taken over angles from 0.10 degrees to 15 degrees two-theta (depending on detector distance) which corresponds to structural features from .25 to 80 nm. Samples may be in liquid or solid form.

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