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The MRSEC Facilities Network is a nationwide partnership of NSF supported MRSEC centers designed to provide support to researchers in the broad area of Materials Research in academic, government and industrial laboratories around the world.
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The
Dimension model AFM uses tip scanning to obtain topographic and phase
imaging of the surface. This method allows samples up to 200 mm in
diameter to be scanned. Apart from polymer samples that are mainly
studied in our lab, this equipment can image semiconductor wafers,
lithography masks, magnetic media, CDs/DVDs, biomaterials and other
materials with sub-nanometer resolution in the vertical (z) dimension. The maximum scan area in the x,y dimension is 100 μm2. In addition
accessories are available to carry out
STM, MFM and imaging under liquid.
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The
Multimode model AFM uses sample scanning to obtain topographic and
phase imaging of the surface and hence the sample size is limited to ~
1 cm2. This equipment can image samples using the Contact
mode, Tapping mode and Imaging under liquid. In addition this equipment
is capable of imaging under variable temperature from room temperature
up to 250°C. |
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