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Facility Director: Prof. Thomas P. Russel
The X-Ray Diffraction and Scattering Facility is well equipped for
experiments in both the wide and small angle regimes. A diffractometer
with Bragg-Brentano optics can be used in either reflection or
transmission modes.
In the transmission mode, a four-circle attachment is available
which allows full textural analysis. In the reflection mode, small
angle reflectivity measurements from thin films are possible. For
photographic recording of wide angle diffraction, Debye-Scherrer powder
cameras and a range of Statton flat-plate cameras are available. The
Statton cameras, which are particularly well suited for the recording
of the anisotropic scatter from fibers, are also equipped with hot
stages that allow research on phase transitions of materials.
Transmission diffraction experiments can also be performed in
either the static or time resolved mode utilizing a Siemen's, two
dimensional, multiwire detector. While this detector provides an
exceptional increase in the siganl-to-noise ratio for isotropic
materials, due to the circular averaging capabilities, the area
detector is ideally suited for use on anisotropic specimens. A similar
detector has also been installed on a pinhole small angle camera which
offers similar capabilities for larger scale morphological features.
This detector is used in combination with a high intensity rotating
anode generator. |
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