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The MRSEC Facilities Network is a nationwide partnership of NSF supported MRSEC centers designed to provide support to researchers in the broad area of Materials Research in academic, government and industrial laboratories around the world.
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This latest XRD instrument from
Philips Analytical is used primarily for powder diffraction but is also capable
of doing texture (pole figure) measurements on bulk materials and thin
films. The built-in structural database
(PDF) allows rapid identification of phases from powder diffraction data. A Bueller high
temperature (>1500 Co)
oven is available for in-situ studies. The instrument has been upgraded
with the Panalytical X'celerator detector for high speed powder XRD
measurements.
XPERT Diffractometer
- X-ray source:
Philips high intensity ceramic sealed tube (3kW)
- Wavelength:
Cu Ka
(1.5405 Å)
- Incident
beam optics: 2 interchangeable fixed slits and one Soller slit.
- Diffracted
beam optics: fixed slit plus programmable receiving slit, graphite
analyzer
- Detectors:
sealed proportional counter and X'celerator PSD for high speed data collection
- Sample
stage: powder stage, texture cradle with sample translation
- Software:
Philips X’PERT suite: Data Collector, Graphics & Identify, Texture
With Bueller high temperature oven
Powder XRD data collected on
XPERT
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