Kratos Axis Ultra XPS system

Purchased in 2001, the Kratos Ultra combines fast, high-sensitivity XPS (X-Ray Photoelectron Spectrometry) with a unique "real-time" imaging capability that allows us to quickly produce 2-dimensional chemical-state maps with spatial resolution as fine as 5 microns. The system also provides state-of-the-art charge compensation for non-conductive specimens. Spectra can be taken from areas as small as 15 microns in diameter. In wide-area scans, most elements other than hydrogen and helium can be detected down to approximately 0.1%. XPS offers a quantitative determination the elemental composition of the top 50 to 70 Angstroms of solid specimens. High-resolution scans can then be taken of elemental peaks of interest, and peak shifts can be used to determine chemical bonding information. In addition, specimens can be tilted to provide a shallower analysis, emphasizing the top 15 to 20 Angstroms. The system is also equipped with a cold stage, and an Ar ion gun for cleaning and depth profiling. Three X-ray sources are available: monochromated Al, and non-monochromated Mg and Al.

Specification: www.kratos.com