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The MRSEC Facilities Network is a nationwide partnership of NSF supported MRSEC centers designed to provide support to researchers in the broad area of Materials Research in academic, government and industrial laboratories around the world.
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FEI Tecnai G2 Sphera Microscope for Life Science Studies
This microscope is designed for 200kV and lower operation voltages, suitable for studies of biological, organic and other beam sensitive materials. For that purpose, this microscope is equipped with a CCD camera (Gatan Ultrascan 1000 2Kx2K) and a cryo-station for specimen preparation and transfer within liquid nitrogen. With a LaB6 emitter, the resolution is 0.27 nm at 200kV. Features: (1) High tilt and large field of view; (2) CompuStage with Smart-Tilt software; (3)Low-dose exposure.
Specimen holders: (1) Single tilt holder ±70°; (2) Double tilt holder (x ±70°, y ±30°).; (2) Gatan cryo-transfer holder.
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FEI Tecnai G2 F30 FEG Microscope
With a field emission gun (FEG) and an U-TWIN lens, this microscope is designed for both high resolution and analytical microscopy. The attachments of this microscope are: (1) A scanning unit with a bright field (BF) /dark field (DF) detector and a high-angle annular dark-field (HAADF) detector for scanning TEM; (2) Gatan Enfina 1000 system for electron energy-loss spectroscopy (EELS) and Z-contrast imaging; (3) Electron despersive X-ray analysis system (EDXA) for chemical information; (4) Gatan wide-angle CCD (2kx2k).
Specimen holder: Double tilt holder (x ±22°, y ±15°).
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JEOL2010 Analytical Microscope + Slow Scan CCD Camera + Energy Loss Spectrometer + Gatan Imaging Filter + Energy Dispersive X-ray Spectrometer
The JEOL2010HR microscope is an analytical microscope equipped with a energy dispersive x-ray system (EDXA) by Oxford and a electron energy loss spectroscopy (EELS) system by Gatan (a Mac-based GIF System). A slow scan CCD camera is attached with the GIF, that allows low-dose as well as the zero-loss imaging (near-elastic scattering imaging method) to be performed. The resolution for analytical use is about 131 eV and 1.2 eV for EDXA and EELS respectively, while the point-to-point resolution in high resolution mode is about 2.3 Å at 200kV. The elements of B and above can be detected with our Oxford Inca system.
Specification: www.jeol.com; www.gatan.com; www.Oxfordxtg.com
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