This microscope can be performed at both tapping and contact mode with highest resolution manufactured. With either the D-type (10x10x25µm) or the J-type scanner (125x125x5µm), images on both atomic and macroscopic scales can easily be obtained. The microscope performs the full range of SPM techniques to measure surface characteristics such as surface topography, elasticity, friction, adhesion, magnetic fields, and electrical fields. Surfaces of a wide range of materials, including conducting and non-conducting samples, can be examined with this microscope. The 2.5Å monolayer of GaN semiconductors can be easily resolved, as shown in the representative images. Attachments: optical viewing sytem, heating stage, signal access module, and vibration isolation tripod.

Specification: www.di.com

The microscope is attached with a heater system that enables the measurements at elevated temperatures up to 250° C in a controlled environment. The temperature drift is +/- 0.025° C. Other attachments: (1) Nanoscope Optical View System (OMV-NTSC); (2) Vibration Isolation tripod.

Specification: www.di.com

di-Dimension 3000/3100 Scanning Probe Microscope

These SPMs have the similar functions in surface measurements with the Milti-Mode microscope as stated above. The major difference is that this microscope is designed for imaging a 6" wafer. A large specimen stage is provided and the microscope is located in an anti-vibration hood. Inside the microscope, there is an optical system by the scanner to guide the scan with an image of the sample surface shown on the screen. With this optical image, users can search a specific feature as small as 0.1µm to scan. The hardware design of this microscope is compatible with electric force and magnetic force microscopy without any additional attachments.

Specification: www.di.com