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JEOL6300F Scanning Microscope.
The JEOL6300F scanning microscope uses a field emission gun with cold
cathode, the highest coherent source available for a commercial
microscope. The resolution is 1.5 nm in secondary electron imaging (SEI)
and 3.0 nm in backscattered electron imaging (BEI) when the microscope is
operated at 30 kV, the highest voltage for this microscope. A
multi-purpose specimen chamber has an eucentric goniometer stage of
(50 x 70 mm) in X-Y movement, 360° rotation and a maximum tilt angle of
60°. The airlock specimen chamber allows up to 32 mm-in-diameter
specimens to exchange, and the size can also be up to 150 mm when the
exchange is carried out without the airlock. In addition to a Polaroid
camera, a computer station is attached for image on-line processing.
Auto functions in focusing, astigmatism correction, and
brightness-contrast adjustment are available. New attachments:
(1) Oxford Inca x-ray system; (2) Oxford CL2 cathodoluminescence system.
Specification:
www.jeol.com
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JEOL6340 FEG Digital Scanning Microscope
JEOL6340F microscope is equipped with a cold field emission cathode operated
at 0.5 to 30 kV. The secondary electron image resolution is 1.2 nm at 15 kV
and 2.5 nm at 1 kV that is resulted from an electromagnetic 4-lens system with a
semi-in-lens objective lens that is designed for the smallest possible aberrations.
Images are displayed with 1280x1024x8 pixels on a PC and the maximum resolution is
2048x2048
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FEI XL40 Sirion FEG Digital Scanning Microscope
High resolution scanning electron microscope completely controlled under WindowNT.
Equipped with a high stability Schottky field emission gun and a large
specimen chamber (379x280 mm door size).
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The scanning probe microscope (SPM) operates exactly as its name implies: a
sharp tip is scanning on sample surface in a controlled contact or
non-contact mode, and the signals carrying surface information are
collected, processed and then plotted on a computer screen. The first base
of SPM was scanning tunneling microscope (STM) that was invented 1982.
After that, it has also been found not only the tunneling current, but also
the atomic force and other kinds of interactions in between tip and sample
surface can be probed. Therefore, the category of SPM samples is greatly
extended from conducting to non-conducting or soft materials since the tip
can work just in a near-surface scan. The name of scanning probe
microscopy summarizes scanning tunneling microscopy, atomic force
microscopy (AFM), scanning capacitance microscopy (SCM), magnetic force
microscopy (MFM) as well as a range of other measuring techniques.
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