Facility Director:    Professor James S. Speck (spec at mrl.ucsb.edu)

Facility Managers:   

Dr. Tom Mates (tmates at mrl.ucsb.edu)

    * Secondary Ion Mass Spectrometry (SIMS)
    * X-ray Photoelectron Spectroscopy (XPS)
    * Surface Elemental Analysis

Dr. Jin-Ping Zhang (jpzhang at mrl.ucsb.edu)

    * Transmission Electron Microscopes (TEM) Scientific Manager
    * Scanning Probe Microscopes (SPM)
    * Computational microscopy facility

Dr. Jan P. Löfvander (jan at engineering.ucsb.edu)

    * Focus Ion Beam Microscopes (FIB)
    * Transmission Electron Microscopes (TEM) Technical Manager
    * TEM sample preparation

Mark Cornish (cornish at engineering.ucsb.edu)

    * Scanning Electron Microscopes
    * Sample preparation
    * Accounting

 
Facility Location:     Engineering II room 1245

Major Equipment:

Transmission electron microscopes:

FEI Tecnai G2 F30 FEG high resolution and analitical microscope (coming)

FEI Tecnai G2 Sphera Microscope for Life Science Studies (in installation)

JEOL 2010 high resolution microscope

 

Scanning electron microscopes:

JEOL 6300F analytical microscope

JEOL 6340F field emission gun microscope

FEI XL40 Sirion FEG microscope

 

Scanning probe microscopes (STM/AFM):

Digital Instruments Multi-mode Nanoscope (2)

Digital Instruments Dimension 3000 microscope

Digital Instruments Dimension 3100 microscope

 

Secondary Ion Mass Spectrometry System:

Physical Electronics 6650 Quadrupole

 

X-ray Photoelectron Spectroscopy System:

Kratos Axis Ultra

 

Focused Ion Beam System:

FEI Focused Ion Beam (Model DB235 Dual Beam)

 

Instruments for Sample preparation:

Gatan precision ion polishing system (Model 691)

Fischione ion polishing system (Model 1010)

Allied MultiPrep polishing machine (Model 15-1000)

Gatan dimple grinder (Model 650)

VCR Dimpler (Model D500)

 

Computer system:

PentiumIV-1.6GHz,SuperMac-220MHz for TEM simulation

PentiumIII-500MHz for SPM image processing

Epson 1600dpi optical scanner for film/image digitization

 

Electron microscopy simulation:

Software for Scanning Electron Microscopy (SEM)

Software for Transmission Electron Microscopy (TEM)

Recharge Rates:

 

Equipment:

$60 per hour for TEMs (2010&Sphera) ($87.6 off campus)

$80 per hour for TEM (F30) ($116.8 off campus)

$50 per hour for SEMs ($73 off campus)

$20 per hour for

$50.06 per hour for SIMS ($73.60 off campus

$30.27 per hour for XPS ($44.50 off campus)

$100 per hour for

 

Development Engineer:

$47.08 per hour ($68.74 off campus): Dr. Tom Mates

$45.46 per hour ($66.38 off campus): Dr. Jin-Ping Zhang

$39.79 per hour ($58.10 off campus): Mark Cornish

Training:

TEM classes are available (no fee for UCSB users) - please contact Dr. Jin-Ping Zhang