X-Ray Photoelectron Spectrometry (XPS) offers a quantitative determination of the elemental composition of the top 80 to 100 Angstroms of solid specimens. High-resolution scans can then be taken of elemental peaks of interest to determine chemical bonding information. In addition, specimens can be tilted to provide a shallower analysis. The UCSB system (Kratos Axis Ultra Spectrometer, Kratos Analytical, Manchester, UK) is also equipped with a cold stage and an Ar ion gun for cleaning and depth profiling. Three X-ray sources are available: monochromated Al, and non-monochromated Mg and Al.  An Ultraviolet (UPS) source is added for valence band studies.  A special sample holder for air-sensitive samples is also available. 

Many XPS systems also feature fast, highly-sensitive, "real-time" imaging capability that allows the recording of 2-D chemical-state maps with spatial resolution as fine as 5 microns. The system also provides state-of-the-art charge compensation for non-conductive specimens. Spectra can be taken from areas as small as 50 microns in diameter and most elements, other than hydrogen and helium, can be detected down to approximately 0.1%.

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         ► Student Laboratory Reports       

                   •Sample Report #1                         

                   •Sample Report #2                    

             •Sample Report #3